电感耦合等离子体原子发射光谱法测定铜精矿和铅精矿中二氧化硅

Determination of silicon dioxide in copper concentrate and lead concentrate by inductively coupled plasma atomic emission spectrometry

提出了一种用电感耦合等离子体原子发射光谱法(ICP-AES)快速测定铜精矿和铅精矿中二氧化硅的方法。采用刚玉坩埚,以过氧化钠为熔剂,在高温下熔融试样,熔块经热水浸取,盐酸酸化处理后进行基体稀释,再加入内标元素Au,采用内标法校正,有效克服了基体效应及仪器波动所产生的影响。本法对二氧化硅的检出限为0.006 3μg/mL,测定范围(质量分数)为0.02%～10%,用于铜精矿和铅精矿标准物质的测定,测得值与认定值一致,相对标准偏差(RSD)小于3%(n=5)。

A determination method of silicon dioxide in copper concentrate and lead concentrate by inductively coupled plasma atomic emission spectrometry（ICP-AES） was developed.The sample was melted at high temperature in corundum crucible using sodium peroxide as flux.The fusion cake was leached with hot water and acidified with hydrochloric acid.After matrix dilution,the internal standard element Au was added.The effects of matrix and instrumental fluctuation could be effectively eliminated using internal standard calibration method.The detection limit of silicon dioxide in this method was 0.0063 μg/mL,and the determination range（mass fraction） was 0.02 %-10 %.The proposed method had been applied to the determination of certified reference materials of copper concentrate and lead concentrate.The determination results were in good agreement with the certified values,and the RSD（n=5） was less than 3 %.