摘要
Virtex-4系列FPGA空间应用中易发生单粒子翻转事件,对设备正常功能的完成带来不良影响。文章给出了单粒子翻转的原理。为解决FPGA单粒子翻转问题,结合工程实践对FPGA抗单粒子3种方法进行了分析和比对,提出了"配置存储区回读CRC结果比对"为最优方法,并给出了示例。同时文章也对FPGA回读及擦洗配置命令序列等关键技术进行了研究。
In space applications, logic state of static memory element are easily altered by single event upsets （SEU） in Xilinx Inc. Virtex-4 Platform FPGA, which is disadvantage effect on the expected functionality. The theory of SEU is intro- duced in this paper. Based on engineering practice, the optimize method of configuration memory and contrast read back CRC results is proposed after analyzing three anti-SEU methods, and some examples are given. At the same time, some key technologies of read back and scrubbing configuration order list are studied.
出处
《空间电子技术》
2011年第2期54-58,共5页
Space Electronic Technology
关键词
单粒子翻转
配置数据流
回读
擦洗
Single event upsets
Configuration bits
Read back
Scrubbing
