摘要
提出了一种新的交替变游程编码的测试数据压缩方案。不像其它文章中仅仅编码连续的"0",该方案采用变长到变长的编码方式对0游程和1游程进行编码。实验数据表明,交替变游程编码能取得较高的压缩效率,能够显著减少测试时间和测试功耗,从而达到降低测试成本的目的。
A new test data compression technique based on alterating variable run-length coding is proposed.It is a variable-to-variable-length code based on encoding lengths of runs of 0s and 1s without limitation on runs of 0s as proposed.Experimental results show that this code can provide a high compression ratio and it also leads to a significant saving in test time,peak and average power,which results in reducing test cost.
出处
《安庆师范学院学报(自然科学版)》
2011年第2期57-60,共4页
Journal of Anqing Teachers College(Natural Science Edition)
基金
安徽省高校优秀青年人才基金项目(No.2010SQRL110)
安徽省高校科学研究项目(No.KJ2010A230)资助
安庆师范学院青年科研基金(No.KJ201007)资助
关键词
测试数据压缩
变长-变长的编码
解压
系统芯片
test data compression
variable-to-variable-length codes
decompression
system-on-a-chip