连续半导体激光器单条阵列老化筛选系统

Burn-in Testing System of CW Semiconductor Laser Single Bar Array

介绍了用于连续高功率半导体激光器单条阵列的老化筛选系统,通过对积分球采集激光功率进行理论分析,确定了积分球内壳的参数。采用水冷积分球,实现了激光功率探测部分的冷却,同时解决了激光功率采集以及球壳内部散热的问题。利用光电探测器、数据采集卡等硬件实现了激光功率信号的光电转换以及模数转换,基于LabVIEW环境开发了激光功率采集软件,实现了对高功率激光的实时采集、记录。最终建立了采集稳定性好、准确度高的老化筛选系统。

The burn-in testing system for the continuous wave（CW）high-power semiconductor laser single bar array was introduced.The parameters of the integrating sphere inner shell were obtained through the theoretical analysis for integrating sphere collecting laser power.Through the water-cooling integrating sphere,the cooling for the laser power detection device was realized,and the problems of the laser power collection and the heat elimination of the integrating sphere inner shell were solved.The photoelectric and analog-to-digital（A/D）conversions of the laser power signal were realized by photoelectric detector,data acquisition card and other hardwares.The software for laser power acquisition was developed based on LabVIEW,the real-time data acquisition and the record of the high power laser were realized.The high stability and high accu-racy burn-in testing system was built finally.