期刊文献+

基于紧缩阈值加速退化试验的长寿命产品可靠性评估 被引量:3

Reliability Assessment for Long-Life Products Based on ADT with Tightened Critical Values
下载PDF
导出
摘要 对于退化失效型产品,当产品的特性参数超过给定阈值时即发生失效,失效阈值定义越严格则对产品功能要求越高,则产品越容易发生因不满足该功能要求而失效,可见产品的寿命数据与失效阈值的定义密切相关.对于长寿命产品,通过紧缩失效阈值的方法,可以在低应力水平下得到更多的失效数据.论文建立了寿命分布与试验应力和失效阈值的关系模型,并提出了通过紧缩阈值加速退化试验数据对长寿命产品进行可靠性评估的方法,最后通过实例验证了方法的有效性. For products whose failures are defined in terms of performance characteristics exceeding their critical values,reliability assessment can be based on degradation measurements by using degradation models.Since the time-to-failure depends on the level of critical value,more life data can be obtained by tightening the critical value.This paper presents a method for the estimation of life distribution for long life products by using life data from degradation measurements.The relationship between life and critical value and stress is modeled and used to estimate the life distribution at a usual critical value design stress.The model parameters are estimated by using maximum likelihood and least square method.At last,an example is used to illustrate the validity of the method.
作者 冯静
出处 《电子学报》 EI CAS CSCD 北大核心 2011年第6期1253-1256,共4页 Acta Electronica Sinica
基金 国家自然科学基金(No.60804054)
关键词 加速退化试验 退化模型 长寿命产品 可靠性评估 紧缩失效阈值 accelerated degradation tests(ADT) degradation model long-life products reliability assessment tightened critical values
  • 相关文献

参考文献9

  • 1Yasuhiko Takemoto, lkuo Arizono. Design of accelerated relia- bility tests based on simple-step-stress model [ A ]. ProceedingsAnnual Reliability and Maintainability Symposium 2003 [ C ]. USA: 1EEE,2003. 111 - 116.
  • 2Sarath Jayatileka, Geoffrey Okogbaa. Use of accelerated life tests on transmission belts for predicting product life, identify- ing better designs, materials and suppliers [ A ]. Proceedings Annual Reliability and Maintainability Symposium 2003[C ]. USA: mEE, 2003. 101 - 105.
  • 3Suk Joo Bae, Way Kuo, etc. Degradation models and impfied lifetime distributions [ J]. Reliability Engineering and System Safety, 2007,92 (6) : 601 - 608.
  • 4Wenbiao Zhao, E A Elsayed. An accelerated life testing model involving performance degradation[A ]. 2004 Annual Sympo- sium of Reliability and Maintainability [ C ]. USA: IEEE, 2004. 324 - 329.
  • 5Gopikrishnan A. Reliability Inference Based on Degradation and Time to Failure Data: Some Models, Methods and Efficiency Comparisoins[ D]. USA: University of Michigan, 2004.
  • 6Vasiliy V Krivtson. Recent advances in theory and applications of stochastic point process models in reliability engineering[ J]. Reliability Engineering and System Safety, 2007,92 (5) : 549 - 551.
  • 7C Joseph Lu, William Q Meeker, Luis A Escobar. A compari-son of degradation and failure-time analysis methods for esti- mating a time-to-failure distribution[J]. Statistica Sinica, 1996, 6(5) :531 - 546.
  • 8Guangbin Yang, Kai Yang. Accelerated degradation-tests with tightened critical values[ J ]. IEEE Transactions on Reliability, 2002,51 (4) :463 - 468.
  • 9冯静,周经伦.长寿命产品退化筛选试验方法研究[J].电子学报,2008,36(8):1538-1542. 被引量:3

二级参考文献9

  • 1梁慧敏,王世成,翟国富.航天继电器在可靠性筛选试验中寿命预测技术的研究[J].低压电器,2004(7):3-7. 被引量:4
  • 2张金槐 唐雪梅.Bayes方法[M].长沙:国防科技大学出版社,1992..
  • 3余碧辉主编.系统可靠性工程[M].北京:国防工业出版社,2004.
  • 4R K Reddy, D L Dietrich. A 2-level environmental-stress- screening(ESS) model: a mixed- distribution approach[ J ]. IEEE. Transactions on Reliability, 1994,43( 1 ) :85 - 90.
  • 5Edward A Polal,Duane L Dielrich. Environmental stress screening strategies for multi-component systems with Weibull failure- times and impert failure detection[ A]. 1995 Proceedings Annual Reliability and Maintainability Symposium[ C]. USA: Institute of Electrical & Electronics Engineers Inc. 1995.223 - 232.
  • 6Edward A Pohl,Duane L Dietrich. Environmental stress screening strategies for complex systems: a 3-level mixed distribution model[ J]. microelectronic Reliability, 1995,35(4) :637 - 656.
  • 7Guaagbin Yang. Environmental- stress- screening using degradation measurements[ J]. IEEE. Transactions on Reliability, 2002, 51(3) :288 - 293.
  • 8Hong-Fwu Yu. Designing a screening experiment with a reciprocal weibull degradation rate[J]. Computer & Industrial Engineering,2007,52:175 - 191.
  • 9D Perlstein, R Welch. A Bayesian approach to the analysis of bum-in of mixed populations[ A]. 1993 Proceedings Annual Reliability and Maintainability Symposium[ C]. USA: Institute of Electrical & Electronics Engineers Inc., 1993.417 - 421.

共引文献2

同被引文献39

引证文献3

二级引证文献5

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部