CTIA型红外焦平面阵列非均匀性研究

Research on Nonuniformity of IRFPA with CTIA Readout Circuit

根据CTIA型红外焦平面阵列的工作原理,分析了非均匀性的来源:探测器芯片、CTIA运算放大器的输入失调电压以及读出电路的积分电容。对这几种因素造成的非均匀性进行了分析、计算和实际测试。最后,提出了使焦平面阵列非均匀性最佳的探测器工作偏置区间。

Nonuniformity of IRFPA with CTIA readout circuit comes from detector diode,input offset voltage of operational amplifier in CTIA and integration capacitor of readout circuit.They are analyzed,calculated and tested in the paper.The best bias region of detector diode in which IRFPA has minimum nonuniformity is obtained in the end.