智能化BIT测试适配器研究

Study on Intelligent BIT Test Adapter

介绍了故障注入的概念和常用手段，提出一种实用、方便的智能化ＢＩＴ测试适配器设计思想。对智能化测试适配器“故障注入节点的设计”、“故障注入电路的实现”、“故障注入器结构体系的设计”、“智能化测试适配器软件包”四个关键技术问题给出了具体的方案。

Describes the concepts and the methodologies of fault injection. An applicable and convenient design idea is proposed for the intelligent BIT test adapter. The four key problems, i.e., the design of injection node, the realization of fault injection circuits, the design of the structure of the fault injection tool and the software package of the intelligent BIT test adapter, are mainly discussed.