常用数字集成电路的在系统自动检测

Auto-Testing of In-System in General Digital IC

介绍了电子设备工作中常用数字集成电路的故障自检。根据各类器件的逻辑特点及其在应用电路中的作用，利用数字电路的冗余功能，分别研究了其在系统中工作的同时进行故障自检的方法。该方法故障覆盖率不高，但简单实用，易于实现。文中还研究了同类器件在电子系统中的联动检测方法，进一步简化自检电路。

Auto testing methods depending on IC redundancy of the general digital IC in a working electronic equipment are discussed. Those methods are quite different according to the IC′s logic character and functions in the circuit used. The rate of covering error is not high, but the circuit is very simple and easy to be implemented. Associative testing of similar ICs is studied so as to simplify testing net. These methods have been simulated on a computer and used in a radar signal processor.