有效线宽ΔH_(eff)和场移S的来源分析

Origin of the Effective Linewidth ΔH_(eff)  and the Field Shift S

考虑了晶粒表层中由杂质和应力引起的表面单轴各向异性场，计算表明非共振ΔＨｅｆｆ 源于晶粒表层的自旋波共振损耗χｓ＋ ＂ ，场移源于χｓ＋ － χｂ＋ 。理论与实验十分一致。

In consideration of the existence of impuraty and strain induced uniaxial anisotropy field H s  in grain surface layers,it is shown by calculation,that the off resonance effective linewidth ΔH eff  arises from the loss of spin wave resonance excited in some grain surface layers,χ s + ' ,and the field shift S is referable to the difference between the real parts of susceptibility in grain surface layers and in the grain interior,χ s + -χ b +  .The theory agrees well with experiments.