期刊文献+

耦合差动式纳米级分辨力位移测量激光干涉仪 被引量:1

COUPLED DIFFERENTIAL LASER DISPLACEMENT MEASUREMENT INTERFEROMETER WITH NANOMETRIC RESOLUTION
下载PDF
导出
摘要 介绍了一种新型的纳米级精度位移测量激光干涉仪的设计原理与应用,该干涉仪以独特的光学原理被命名为“耦合差动式激光干涉仪”.其结构简洁紧凑,性能稳定,光路布局对称性好,不存在死光程,光程差倍增,容易装调,符合阿贝原则和结构变形最小原则,在10mm (可以扩展至50 m m )测量范围内,获得了λ/800 的分辨力和纳米级的测量精度. A new laser displacement measurement interferometer with nanometric accuracy has been developed.It's defined “Coupled Differential Interferometer”.The new interferometer is simple in concept,stable in performance,easy to set up and align,symmetric in optical paths and free of optical deadpath.A λ /800 resolution and an accuracy of a few nanometers can be achieved within the range of 10 mm.
机构地区 天津大学
出处 《天津大学学报》 EI CAS CSCD 1999年第6期665-667,共3页 Journal of Tianjin University(Science and Technology)
关键词 纳米计量 位移测量 激光干涉仪 纳米级精度 nanometrology laser displacement measurement differential interferometry laser interferometer
  • 相关文献

参考文献4

  • 1陆伯印,朱鸿锡,曲兴华,赵美蓉.大位移纳米级精度分子测量机的研究[J].仪器仪表学报,1993,14(1):107-112. 被引量:3
  • 2赵美蓉.纳米级精度激光位移测量技术的研究:博士学位论文[M].天津大学精密仪器与光电子工程学院,1996..
  • 3赵美蓉,博士学位论文,1996年
  • 4叶声华,激光在精密计量中的应用,1980年

二级参考文献1

  • 1Zhang G,CIRP,1988年,37卷,1期

共引文献2

同被引文献25

  • 1[6]Yasuhiro Takaya, et al..Fundamental Study on the New Probe Technique. Measurement, 1999,25(1):9~18.
  • 2[7]Wei Gao,Robert J.Hochen, et al..Construction and testing of a nanomachining instrument. Precision Engineering,2000,24:320~328.
  • 3[8]Mike Holmes, Robert Hochen, David Trumper.The long-range scanning stage:a novel platform for scanned-probe microscopy.Precision Engineering,2000,24:191~209.
  • 4[11]Yasuhide Takahashi.Optical interferometry for nanometer measurement of a large step.Int.J.,Japan Soc.Prec.Eng.,1994,26(1).
  • 5[20]G.Jger,Dr.-Ing.E.Manske,T.Hausotte,H.-J.Bchner.Nanomeasuring machine.MICRO.Tec 2000 Hannover:551~556.
  • 6[21]G.Jger.Laser-based measurement to nanometer scale accuracy.International Symposium on Laser Metrology for Precision Measurement and Inspection in Industry,1999,Florianopolis(Brazil).
  • 7[22]G.Jger.Precision distance measurement by means of miniaturized interferometers. XIII IMEKO WORLD CONGRESS,1994,Torino (Italy).
  • 8[23]Teague E.,Clayton.J.Vac.Sci.Technol.B,1989,B7(6):1898~1902.
  • 9[24]Xu Y,Smith S T,Atherton P D.A metrological canning force microscope.Precision Engineering,1996,19(1):46~55.
  • 10[26]Zhao Meirong,Qu Xinghua, Wang hailong,Lu Boyin.New Laser Interferometer with OPD Multiplication for Nanometer Measurement. Chinese Journal of Lasers B,1999,B8(5):402.

引证文献1

二级引证文献16

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部