气氛环境介电温谱测试系统的研制

Development of the testing system for dielectric temperature characteristic of dielectrics in various atmospheres

设计了一套可用于气氛环境下介电温度特性的测试系统,并将气氛环境引入到测试过程中,从而实现了不同气氛环境下(氧化、中性或还原性气氛)对电子材料介电性能参数的测试。测试结果表明,电子材料的电学性能参数受到测试气氛的影响和作用,为研究材料内部复杂的缺陷结构和极化机制提供了一种直接有效的测试手段。实验证明,测试系统运行可靠,数据精确。

Considering that the testing atmosphere will directly affect the defect structure and electrical performance of the materials, a new type of testing system for dielectric temperature characteristic of dielectrics in various atmospheres has been designed and developed. The test system provides the automated measurement of dielectric characteristics with temperature in different atmosphere （ Oxidizing, neutral or reducing atmosphere）. The experimental results show that dielectric properties are strongly dependent on the atmospheres. The method provides a simple and effective way for the synthesis of complicated structural defects and polarization mechanism.