摘要
用TG 热重仪测定Pt- Pd - Rh 合金的挥发失重曲线, 用X 光电子能谱(XPS) 和溅射剥离技术确定其氧化态表层及次表层组元化学状态和浓度。结果表明合金挥发失重曲线遵循: Δm = K0tn ———直线失重规律。合金组元化学态为Pt0 、Pd0 、Rh0 、Rh2O3 , 次表层为Pt0 、Pd0 、Rh0 、RhO2 , Pd0 相对富集于表层。讨论了Pd 及少量Ru 、Ce 对Pt - Pd -
The thermogravimetric analysis was used to measure the volatilization loss curves of Pt-Pd-Rh alloys.The X-ray photoelectron spectroscopy and the sputtering stripping method were used to determine the chemical state and the concentration of constituent on the surface and subsurface of Pt-Pd-Rh alloys.The results showed that:the volatilization loss of the alloys obeyed a Δm=k 0t n straight line loss law.The chemical states of constitute are Pt 0,Pd 0,Rh 0,Rh 2O 3 on the surface,and Pt 0,Pd 0,Rh 0,RhO 2 on the subsurface.Pd 0 was rich on the surface.The influence of Pd,small Ru,Ce on the volatilization loss and the surface construction of Pt-Pd-Rh alloys were discussed.
出处
《贵金属》
EI
CAS
CSCD
北大核心
1999年第4期12-16,30,共6页
Precious Metals