8TANG C, LUO E. Fault diagnosis of analog circuit using multi-objective linear programming and fuzzy [ C ]. IEEE Testing and Disgnosis, 2009 : 1-4.
9LENNOX B, RUTHERFORD P. A novel fault prediction technique using model degradation analysis[C]. Processing of the American Control Conference, 1995 : 3274-3278.
10YILMAZ E, MEIXNER A. An industrial case study of analog fault modeling [ C ]. VLSI Test Symposium, 2011 : 178-183.