拓扑绝缘体表面态的STM研究

Scanning tunneling microscope studies of topological insulators

文章主要介绍了利用扫描隧道显微镜对拓扑绝缘体表面态进行的一系列研究工作,包括拓扑绝缘体表面态的电子驻波以及拓扑表面态的朗道量子化现象.这些工作对于拓扑绝缘体基本性质的确立以及深入理解具有十分重要的意义.

We summarize recent scanning tunneling microscope studies of topological insulators, including the observation of electron standing waves and the Landau quantization of topological surface states. These works have contributed greatly to our understanding of topological insulators.