脉冲激光试验在宇航器件和电路系统抗单粒子效应设计中的初步应用

Applications of pulsed laser test on single event effect hardening for aerospace components and circuit systems

抗单粒子效应加固是宇航器件研发和卫星电路系统设计面临的重要难题。准确、有效的单粒子效应试验评估对此问题的解决有巨大帮助。中国科学院空间科学与应用研究中心于近十年在国内自主发展了用于单粒子效应评估的脉冲激光试验相关装置、试验技术和方法,对宇航器件和卫星电路开展了初步应用。通过脉冲激光试验,能够快速甄别、定位宇航器件试样的单粒子效应薄弱点,以及快速地摸底评估出芯片的整体加固性能。对于卫星电路系统,脉冲激光试验不仅能够快速摸底评估拟用器件的抗单粒子效应性能,而且能够针对芯片空间分布和电路时序变化进行扫描和定点测试,验证加固效果。

Single event effect（SEE） hardening is a challenge in the development and design of components and circuit systems for space applications,where an accurate and efficient evaluation of SEE by test is essential.In the past decade or so,the Center for Space Science and Applied Research of Chinese Academy of Sciences developed facilities and methods for single event effect tests by using pulsed laser,and carried out some preliminary tests on aerospace components and circuit systems.The pulsed laser facilities can be used to identify and locate SEE vulnerable points on the prototype of chips,as well as to evaluate the general SEE response of the whole chips.As for the circuit systems,the pulsed laser facility can not only provide principal evaluations on the SEE characteristics for candidate components,but also test and verify the radiation hardening design by means of spatial scanning of chips and time testing of the circuit.