摘要
介绍了一种对真空电子显示器件的可靠性进行评估的新方法。该方法是利用真空电子显示器件（ＣＲＴ）的生产工艺和所采用的主要原材料两方面的可靠性数据，根据ＣＲＴ 的失效模式和可靠性理论，运用数理统计的多远回归分析法，导出评价ＣＲＴ 的可靠性的数学模式，进而找出ＣＲＴ 基本失效率与工艺。
A new approach to evaluate the reliability of vacuum electron display divices is introduced,based on the reliability data form other CRT manufacturing process including both technology and materials.According to the failure rate model and theory of reliability,a calculating model for evaluating reliability of CRT can be deduced with the help of a multivariate regression analysis in mathematical statistics.Then,the relationship between the failure rate of CRT and other key factors,such as technology and materials can be investigated.
出处
《真空电子技术》
1999年第6期53-58,37,共7页
Vacuum Electronics
关键词
显示器件
电子真空器件
可靠性
Failure rate mode
Conventional life test
Mathematical statistics
Multivariate regression analysis
