摘要
采用Ｘ 射线衍射方法精确测定钨粉和钴粉的点阵常数。测定结果，钨的点阵常数为ａ ＝０．３１６ ４６７ ｎｍ ，钴的点阵常数为ａ ＝ ０ ．３５４ ４１０ ｎｍ 。钴粉的点阵结构以面心立方为主，仅存在微量的密排六方结构。
Lattice constants in tungsten and cobalt were precisely measured by X ray diffraction. The results of measurement are that the lattice constant S in tugnsten is a=0.316468nm, and in cobalt is a=0.354410nm. The crystal structure of fcc is dominant in cobalt powder, and hcp only a few.
出处
《稀有金属与硬质合金》
CAS
CSCD
1999年第4期30-36,共7页
Rare Metals and Cemented Carbides
关键词
钨
钴
点阵常数
X射线衍射分析
tungsten
cobalt
lattice constant
x ray diffraction
