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一种模块化通用测试平台的设计 被引量:5

Designs of a modular general test platform
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摘要 针对现阶段电子装备的测试需求复杂化程度高和更新速度快的特点,设计了1种模块化、通用化的测试平台。该测试平台基于常用的测试技术,采用模块化的设计思路,通过对硬件电路和FPGA固件进行合理的分块设计,实现灵活组建多种电子装备的测试设备。模块化测试平台的设计,具有较高的通用性和实用性,为缩短测试设备的研制周期和降低开发成本提供了新的思路。目前,基于该测试平台研制了多个型号电子装备的测试设备并交付使用,工作稳定可靠,满足实际应用需求。 For the test needs of the electronic equipment with the characters of high degree of complexity and rapid renewal in present stage,a modular general test platform is designed.The test platform is based on common testing techniques with modular design ideas,through the reasonable block design to the hardware and FPGA firmware,to form a variety of test equipment of electronic equipment flexibly.The design of modular test platform with high versatility and practicality provides a new way of thinking in reducing the development cycle of the test equipment and lessening the development costs.Currently,the test platform has been used in several models of electronic test equipments with its stability and reliability to meet the practical needs.
出处 《电子测量技术》 2011年第7期83-87,共5页 Electronic Measurement Technology
关键词 测试平台 模块化 通用化 DSP test platform modular universal DSP
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