摘要
As the market competition among enterprises grows intensively and the demand for high quality products increases rapidly, product quality inspection and control has become one of the most important issues of manufacturing, and improving the efficiency and accuracy of inspection is also one of problems which enterprises must solve. It is particularly important to establish rational inspection planning for parts before inspecting product quality correctly. The traditional inspection methods have been difficult to satisfy the requirements on the speed and accuracy of modern manufacturing, so CAD-based computer-aided inspection planning （CAIP） system with the coordinate measuring machines （CMM） came into being. In this paper, an algorithm for adaptive sampling and collision-free inspection path generation is proposed, aiming at the CAD model-based inspection planning for coordinate measuring machines （CMM）. Firstly, using the method of step adaptive subdivision and iteration , the sampling points for the specified number with even distribution will be generated automatically. Then, it generates the initial path by planning the inspection sequence of measurement points according to the values of each point＇s weight sum of parameters, and detects collision by constructing section lines between the probe swept-volume surfaces and the part surfaces, with axis-aligned bounding box （AABB） filtering to improve the detection efficiency. For collided path segments, it implements collision avoidance firstly aiming at the possible outer-circle features, and then at other collisions, for which the obstacle-avoiding movements are planned with the heuristic rules, and combined with a designed expanded AABB to set the obstacle-avoiding points. The computer experimental results show that the presented algorithm can plan sampling points＇ locations with strong adaptability for different complexity of general surfaces, and generate efficient optimum path in a short time and avoid collision effectively.
As the market competition among enterprises grows intensively and the demand for high quality products increases rapidly, product quality inspection and control has become one of the most important issues of manufacturing, and improving the efficiency and accuracy of inspection is also one of problems which enterprises must solve. It is particularly important to establish rational inspection planning for parts before inspecting product quality correctly. The traditional inspection methods have been difficult to satisfy the requirements on the speed and accuracy of modern manufacturing, so CAD-based computer-aided inspection planning （CAIP） system with the coordinate measuring machines （CMM） came into being. In this paper, an algorithm for adaptive sampling and collision-free inspection path generation is proposed, aiming at the CAD model-based inspection planning for coordinate measuring machines （CMM）. Firstly, using the method of step adaptive subdivision and iteration , the sampling points for the specified number with even distribution will be generated automatically. Then, it generates the initial path by planning the inspection sequence of measurement points according to the values of each point＇s weight sum of parameters, and detects collision by constructing section lines between the probe swept-volume surfaces and the part surfaces, with axis-aligned bounding box （AABB） filtering to improve the detection efficiency. For collided path segments, it implements collision avoidance firstly aiming at the possible outer-circle features, and then at other collisions, for which the obstacle-avoiding movements are planned with the heuristic rules, and combined with a designed expanded AABB to set the obstacle-avoiding points. The computer experimental results show that the presented algorithm can plan sampling points＇ locations with strong adaptability for different complexity of general surfaces, and generate efficient optimum path in a short time and avoid collision effectively.
基金
Tsupported by Innovation Fund of Ministry of Science andTechnology of China for Small Technology-Based Firms (Grant No.04C26223400148)
