期刊文献+

扫描探针显微镜中数据格式的分析及转换程序的设计

Standardization and transform of SPM data formats
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摘要 随着扫描探针显微镜技术发展和广泛应用,扫描探针显微镜的技术标准化问题在国内外受到越来越多的关注。然而在数据格式方面,由于所用硬件平台的不同等原因,各制造商所生产的扫描探针显微镜大多使用专用的数据格式。这些数据格式又往往互不兼容,给数据后续的分析处理和交流共享带来不便。本文首先对扫描探针显微镜中数据格式的发展及应用较多的格式进行了分析,然后从扫描探针显微镜现有数据的类型、内容和特点出发,研究了规范扫描探针显微镜数据格式的基本要求和思路;经过比较和筛选提出了一种基于HDF5标准(hierarchical data format,HDF)的标准格式方案;并用C++语言实现了对该格式的操作及其与几种专用数据格式之间的相互转换,完成了格式方案和代码资源的开源共享。 Standardization of SPM(scanning probe microscope) is drawing more and more attention nowadays.Most data formats in SPM are not compatible to each other,leading to the inconvenience of their subsequent analysis,processing and sharing.It is necessary to establish an open data format which has good compatibility and scalability.This paper analyzed the development of SPM data formats and some typical formats,and studied its standardization.Based on HDF5(hierarchical data format,HDF),a solution for the standardization was given.A realization with C+ + programming language was demonstrated.The solution and all related codes were published via internet,which were available and free to anybody.
出处 《电子显微学报》 CAS CSCD 北大核心 2011年第3期215-221,共7页 Journal of Chinese Electron Microscopy Society
基金 广东省教育部产学研项目(No.2010B090400123)
关键词 扫描探针显微镜 数据格式 标准化 格式转换 开源 scanning probe microscope(SPM) data format standardization transform open source
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参考文献13

  • 1Fujita D, Itob H, Ichimura S, et al. Global standardization of scanning probe microscopy [ J ]. Nanotechnology, 2007, 18:084002.
  • 2Fujita D, Onishi K, Xu M S. Standardization of nanomaterials characterization by scanning probe microscopy for societal acceptance [ J ]. Journal of Physics: Conference Series, 2009, 159:012002.
  • 3王春梅,井藤浩志,孙洁林,胡钧,沈电洪,一村信吾.研究开发适应于国际标准的SPM针尖特性表征结构(英文)[J].电子显微学报,2007,26(6):576-581. 被引量:1
  • 4Powell C J, Shimizu R. Development of standards for surface analysis by ISO technical committee 201 on surface chemical analysis [ J ]. Surface and Interface Analysis,1997, 25:860-868.
  • 5ISO 14976. Surface chemical analysis-Data Transfer Format[ S]. 2000.
  • 6http ://www. di. corn/[ EB/OL]. 2009.
  • 7XPMPro User Manual. http ://www. rhk-tech, come EB/ OLd. 2009.
  • 8http ://www. spm. com. cn[ EB/OL]. 2009.
  • 9Horcasl I,Fern6n-dezl R, G6mez-Rodrlguez J M, et al. WSXM : A software for scanning probe microscopy and a tool for nan-otechnology [ J ]. Rev Sci Instrum, 2007, 78:013715.
  • 10http://www, unidata, ucar. edu/soflware/netcdf/[ EB/ OL]. 2009.

二级参考文献12

  • 1International Electrotechnical Commission homepage http:// www. iec. ch/.
  • 2International Telecommunication Union homepage http:// www. iso. org
  • 3Binnig G, Rohrer H. Scanning tunneling microscopy[J]. Helv Phys Acta, 1982,55:726- 735.
  • 4Binnig G, Rohrer H, Gerber Ch, Weibel E. 7 × 7 reconstruction on Si (Ⅲ) resolved in real space [ J ]. Phys Rev Lett, 1983, 50 : 120 - 123.
  • 5Gerber C, Lang H P. How the doors to the nanoworld were opened [ J ]. Nature nanotechnology, 2006,1 : 3 - 5.
  • 6Fujita D, Itoh H, Ichimura S, Kurosawa T. Global standardization of scanning probe microscopy [ J ]. Nanotechnology, 2007,18 : 084002.
  • 7ISO 18115:2001 Surface Chemical Analysis-Vocabulary.
  • 8Gonda S, Doi T, Kurosawa T, et al. Accurate topographic images using a measuring atomic force microscope[J]. Appl Surf Sci, 1999,144 - 145:505 - 509.
  • 9Gonda S, Doi T, Kurosawa T, et al. Real-time, interferometrically measuring atomic force microscope for direct calibration of standards [ J ]. Rev Sci Instrum, 1999, 70 : 3362 - 3368.
  • 10Grutter P, Zimmermannedling W, Brodbeck D. Tip artifacts of microfabricated force sensors for atomic force microscopy [J]. Appl Phys Lett, 1992,60:2741 - 2743.

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