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用Ti箔连接Si_3N_4/Ni的界面结构与元素扩散 被引量:2

Interfacial structure and element diffusion in the bonding Si_3N_4 to Ni with Ti foil
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摘要 用Ti箔在1 323 K 进行Si3N4 与Ni之间的连接,并对连接界面区的微观形貌、成分分布和界面反应产物进行了分析研究. 结果表明:通过Ni与Ti之间的相互扩散,在Si3N4 表面形成浸润良好的Ti-Ni液体合金,实测Ti-28Ni共晶合金1 323 K 时在Si3N4 表面的浸润角为9°. 基于EDX,XRD 测定结果和热力学分析,确定界面结构为:Si3N4/TiN(反应层Ⅰ)/Ti5Si3+ Ti5Si4+ Ni3Si(反应层Ⅱ)/Ni-Ti化合物层/Ni固溶体/Ni. 反应层Ⅰ和反应层Ⅱ均随连接时间的增加而增厚,但反应层Ⅱ的成长速率和厚度明显高于反应层Ⅰ. 这种界面结构形式在0.9~7.2 ks 的连接时间范围内始终没有发生变化. Bonding of Si\-3N\-4 to Ni with Ti foil was performed at 1 323 K. The interface microstructures, composition distribution and the reaction products were observed and investigated by SEM, EDX and XRD analyses, respectively. It was shown that through the interdiffusion of Ti and Ni, Ti\|Ni liquid alloy, which had excellent wetting power, was formed on the surface of Si\-3N\-4, wetting angle was 9° for Ti\|28Ni eutectic liquid alloy on Si\-3N\-4 surface. It was comfirmed that interfacial structure with a transition layer of Si\-3N\-4/TiN(reaction layer Ⅰ)/Ti\-5Si\-3+Ti\-5Si\-4+Ni\-3Si(reaction layer Ⅱ)/Ni\|Ti compound/Ni solid solution/Ni was formed, based on EDX and XRD analytic results, and from the point of thermodynamics. The thickness of reaction layer Ⅰ and Ⅱ increased with increasing bonding time, however, the thickness and the growth rate of reaction layer Ⅱ were obviously larger than those of reaction layer Ⅰ. There was no change in the type of the interfacial structure mentioned above within bonding time from 0.9 to \{7.2\} ks.
出处 《浙江大学学报(自然科学版)》 CSCD 1999年第6期587-591,共5页
关键词 连接 界面结构 扩散 氮化硅 钛箔 弯曲试验 Si_3N_4 Ti Ni bonding interfacial structure diffusion
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