摘要
提出了一种快速评价电子元器件的新方法,该方法具有快速、准确、成本低、效率高等优点。利用Arrhenius方程,能快速准确地确定元器件退化的失效敏感参数和退化机理;可对单样品求出与失效机理相关的失效激活能和寿命;通过多样品试验,可得到寿命分布、寿命加速特性和失效率等可靠性参数。以DC/DC电源变换器和高频小功率管3DG130为例,通过实验与现场数据的对比,证明了新方法的正确性和有效性。该方法适用于失效率优于10-7/h(λ<10-7/h)的高可靠性产品的定量评价。
A novel method for rapid evaluation of electronic components was proposed,which was faster and more accurate at a lower cost.Using Arrhenius equation,the new approach could 1） identify failure sensitive parameters of degraded components and its degradation mechanism more accurately in a shorter time;2） calculate failure activation energy and lifetime associated with failure mechanism for individual sample;and 3） obtain reliability parameters,such as lifetime distribution,lifetime acceleration characteristics and failure rate.With DC/DC converter and high-frequency low power transistor as examples,the new approach was validated by comparing experimental results with field data.The proposed method is suitable for quantitative evaluation of products with failure rate better than 10-7/h（λ10-7/h）.
出处
《微电子学》
CAS
CSCD
北大核心
2011年第4期621-626,共6页
Microelectronics
关键词
Arrhenius方程
恒定电应力温度斜坡法
激活能
Arrhenius equation
Constant electrical stress and temperature ramp method
Activation energy
