模拟电路故障分析与诊断方法研究

Research about Analog Circuit Malfunction Detect and Diagnoses Method

随着电子技术的飞速发展,集成电路的应用覆盖了社会的方方面面,但集成电路模拟部分故障难于分析与诊断的问题在很大程度上限制了它的开发维修成本与实际工作效应。该文分析了经典与现代的模拟电路故障分析方法,比较了他们的优点与不足,并结合实际状况提出新的故障分析与诊断方法的研究思路。

With the development of the electronic technique,it＇s more popular of the application of integrated circuit（IC）.But it＇s very difficult to find out the malfunction of analog part of IC,that enhances the cost of exploiture and maintenance of IC,and reduces its work efficiency.This paper analyzes typical and present-day methods of malfunction detect of analog part of IC,compares its advantages and shortcomings.At last,a new malfunction detect method＇s idea is proposed basing on practicality.