高功率微波介质击穿中X射线和紫外线的初步诊断

X-ray and ultraviolet ray diagnosis of high power microwave dielectric breakdown

研制了一套宽光谱探测系统,该系统包括紫外成像探测器和X射线成像探测器两个工作单元。利用该系统对高功率微波(HPM)源运行及聚四氟乙烯介质窗受微波场作用而发生击穿时实验环境中的紫外线和X射线进行了初步诊断。结果表明:HPM源运行参数为重复频率100 Hz,运行时间5 s,介质窗未发生击穿时,微波源二极管区产生的X射线剂量为9.28×102～1.64×103Gy,介质窗发生击穿时,环境中X射线剂量为5.38×102～1.09×103Gy;随着微波脉冲重复频率和运行时间的增加,产生的X射线剂量明显增加。此外,利用该系统证实了实验环境中紫外线的存在。

A broad spectra detection system is developed,which includes the UV-ray imaging detector and X-ray imaging detector.By this system,the UV-ray and X-ray induced by dielectric breakdown which occures in vacuum under microwave field are diagnosed.The results show that the X-ray dose is 9.28×102~1.64×103 Gy in the environment and 5.38×102~1.09×103 Gy when dielectric breakdown occurs,as the operation parameters of HPM source is 100 Hz and 5 s.As the HPM pulses repetition frenquence and operation time increases,accordingly,the induced X-ray dose increases obviously.Furthermore,the UV-ray induced by HPM dielectric breakdown can be observed through this broad spectra detection system.