多层介质膜的体吸收与界面吸收研究

Measurement of bulk and interface absorption in Multilayer coatings

以TiO_2/SiO_2膜系为例,报道了用横向光热偏转技术研究多层介质膜体、面吸收的实验方法与实验结果.文中对实验结果作了分析讨论并把它与文献报道的光声法作了比较.

By an appropriate variation in the thickness of the high and low refracting components, a the bulk and interface absorption of dielectric TiO2/SiO2 multilayer stacks was investigated using transverse photothermal deflection technique. The results are in good agreement with those previously reported using photoacoustio method.