摘要
介绍应用X射线荧光光谱法测定硅铁合金中w(S)i、w(P)、w(S)的样品制备方法、基体干扰及其校正、分析的准确度和精密度。
The preparation of ferrosilicon samples to determine w （Si） , w （P） , w （S） by X-ray fluorescence spectrometric method, the matrix interference and its correction, the analysis accuracy and precision were introduced.
关键词
X射线荧光光谱法
硅铁合金
SI
P
S
X-ray Fluorescence Spectrometric Method
Ferrosilicon
Si
P
S
