摘要
在高科技领域,系统故障诊断变得越来越重要,文章对现代数字系统故障如何诊断进行研究。介绍了建立数字系统故障模型,完全检测测试集构成方法,综述了伪穷举测试法、伪随机测试法、内自测试法及特征分析法。笔者认为对数字系统可测试性改善有效方法有:增加控制点和观察点、保留电路中必要冗余项、将计数器和移位寄存器由长变为多个短、划分大的组合电路为若干个子电路。
The system fault diagnosis is becoming increasingly important in the high-tech field. In this paper, the way how to diagnose the digital system fault, tb establish digital system fault model, and to constitute a complete detection test set method are explored. The pseudo-exhaustive testing method, pseudo-random testing method, the inside self testing method, and characteristic analysis method'are discajssed in details. The testability of digital systems can be improved by increasing the control points and observation points, retaining the necessary redundant items, cutting the long counters and registers into a number of short ones, and dividing the large combination circuits into a few sub-circuits.
出处
《信息化研究》
2011年第4期1-3,7,共4页
INFORMATIZATION RESEARCH
关键词
数字系统
故障诊断
可测试性
digital system
diagnosis of fault
testability