摘要
在试验基础上,定性分析了各因素对漏电电流的影响;在解释漏电电流产生机理的同时,提出简化计算模型,并通过试验对模型进行了验证。得到结论如下:在支路电阻Rp较大时,单体数为N的双极性电堆,第n个单体的漏电电流jn=(N-2n+1)E/2Rp;第n个单体和第n+1个单体间的电流损耗为:In=(nN-n2)E/2Rp(n<N)。
In this paper, the effects of various factors on leakage currents were analyzed qualitatively by experiments. The mechanism of leakage currents was explained, and at the same time, the simplified model was proposed and validated through experiments. The results show that: for bipolar stack of N cells, if the bypass resistance Rp is large, the leakage current of No. n^th cell is jn=(N-2n+1)E/2Rp. And the current loss between the No. n^th and (n+1)^th cells is In=(nN- n^2)E/2 Rp(n〈N).
出处
《电源技术》
CAS
CSCD
北大核心
2011年第9期1082-1085,共4页
Chinese Journal of Power Sources
关键词
漏电
支路
电流损耗
双极性电堆
铝氧化银电池
leakage
bypass
current consumption
bipolar cell stacks
aluminum silver oxide battery