基于相关性模型的BIT诊断策略技术研究

Built-in test diagnosis strategy design based on dependency model

提出了一种基于相关性模型的机内测试诊断策略。首先根据机内测试系统的诊断策略模型,以相关性矩阵为基础,综合考虑可靠性和测试代价等因素,利用AO*算法构建了决策树;然后根据信息量的大小依次选择测试点,并确定出优化的诊断策略序列。实例分析结果表明,该方法计算复杂度小,所得的诊断策略在较低的测试代价下可以有效提高机内测试的故障检测和隔离率。

This paper presented an efficient algorithm of built-in test diagnosis strategy based on the dependency model.At first,considering reliability and testing costs based on the dependency matrix,according to the diagnostic strategy model of BIT,the AO＊ algorithm built the decision-making tree,then test points could be selected based on the information gain values,and a more efficient diagnosis strategy sequence could be constituted.The application example shows that this algorithm ensures to reduce the complexity and improves the BIT fault detection and isolation under less testing costs.