基于可变电子负载的光伏阵列特性测试技术

Technology of Photovoltaic Array Characteristic Test Based on Variable Electronic Load

针对光伏阵列的现场I-V特性曲线测试,提出了一种基于非线性可变电子负载的简易测试方法,该方法利用MOSFET的压阻控制特性作为非线性可变电阻负载,结合高速A/D采样和数据处理,实现对光伏阵列的I-V特性测试。较常规的电容动态充电I-V特性曲线测试方法,该方法具有体积小、成本低、精度高、测试过程可控等特点。详细介绍了该系统的结构原理、测试方法和特点,并利用可变电子负载进行了样机研制和现场测试,实验结果表明该方法具有一定的参考价值,满足工程要求。

This paper proposes a simple testing method based on a no-line variable electrical load accounting to the test of field measurement of I-V characteristic curve of photovoltaic array.This method uses MOSFET as a nonlinear variable resistance,since it has the voltage-resistance controlled characteristics.Along with the use of high-speed A/D sampling and digital processing modules,the I-V characteristic curve of photovoltaic array is tested.Compared with the traditional method of the dynamic capacitor charge I-V characteristic curve,this method takes the advantage of small volume,low cost,high accuracy and testing procedure can be controlled.The paper introduces the constructional and testing method and characteristics,and also developes a prototype and testes it by using variable electrical load.The experimental results indicate the method has referenced value and meets the demand of engineering.