摘要
本文用蜡环成形滤纸定量吸附由微量进样器分取的50μl试液,制成薄样进行X射线荧光光谱分析,实现了对样品中高含量WO_3、SnO_2的定量测定。被测组份的荧光强度与浓度在0—500μg/50μl范围内有良好线性关系。方法操作简单、制样速度快、成本低、稳定性好。
A 50 μl aliquot of sample solution is applied to a small area circled with wax on a piece of filter paper which is used as substrate in XRF analysis. The technique is simple and rapid. A linear relationship between the fluorescence intensity and the concentrations of WO3 or SnO2 holds over the range 0-500μg in 50μl.
出处
《岩矿测试》
CAS
CSCD
北大核心
1990年第4期272-273,共2页
Rock and Mineral Analysis
关键词
滤纸
X射线
荧光光谱法
钨
XRF, SnO_2 and WO_3 determination, wax circle technique
