摘要
随着场效应管器件在电子设备的应用越来越广泛,而相关的测试和筛选需求也在相应增加,针对目前本实验室在场效应管器件筛选过程中不具备的栅偏、反偏及功率老化等试验能力,在现在实验室具备的筛选试验设备平台上,设计并建立一套场效应管器件的栅偏、反偏及功率老化试验装置,提高实验室的检测能力。对整个设计、试验及结果验证过程做了详细介绍,该装置经过专家评审和近一年的使用验证结果表明:该筛选装置符合相关标准,使用稳定可靠,值得推广应用。
For the FET is widely used in electronic equipment,the demand for related testing and screening is increasing.A set of devices for gate bias test,reverse bias test,power aging test of FET is designed and established,based on the current screening equipment,so as to improve the test ability of the lab,which is aimed at the current lab lacks of the ability for gate bias test,reverse bias test and power aging in the process of screening the FET.The process of design,test and results verification are mainly introduced.After being reviewed by the experts and nearly one-year used,it turns out that this screening device can meet the standard,and is stable and reliable,which is deserved to be widely used.
出处
《国外电子测量技术》
2011年第9期56-59,共4页
Foreign Electronic Measurement Technology
关键词
栅偏试验
反偏试验
功率老化
测试筛选
gate bias test
reverse bias test
power aging
test and screening