摘要
胰岛素抵抗(IR)是2型糖尿病(T2DM)的主要发病机制之一,T2DM患者确诊前大都经历了长期的IR进展过程。目前研究发现,参与IR发生的众多机制如胰岛素信号转导途径、线粒体功能障碍、氧化应激、内质网应激、游离脂肪酸等均与自噬(autophagy)的发生有关,但自噬活性在IR及高胰岛素血症中的作用及其机制仍不甚明确。
Insulin resistance(IR) is one of the main causes of type 2 diabetes mellitus(T2DM) , patients with T2DM almost experience long-term IR before they were diagnosised. Recent studies show that insulin signaling pathway, mitochondrial dysfunction, oxidative stress, endoplasmic reticulum stress and free fatty acids which participate in IR are all correlated with autophagy. But it is still uncertain that the mechanism and effect of autophagy on IR.
出处
《国际内分泌代谢杂志》
2011年第5期314-316,共3页
International Journal of Endocrinology and Metabolism
基金
安徽省科技计划项目(10021403081)
关键词
自噬
胰岛素抵抗
2型糖尿病
Autophagy
Insulin resistance
Type 2 diabetes mellitus