TD-LTE系统终端邻道泄漏功率比的测试方法

Test method of adjacent channel leakage ratio for TD-LTE terminal

LTE(long term evolution)及其后续演进已成为全球移动通信领域开发的热点。在LTE产业链中,终端射频测试是相对薄弱的环节;信道带宽的增大又对采样速率及硬件处理能力提出很高的要求,成为制约终端射频指标测试的瓶颈。在分析终端射频邻道泄漏功率比(adjacent channel leakage power ratio,ACLR)测试原理、测试方法及实现技术的基础上,提出一种通过修改测试仪表接收机射频本地振荡器频率来增大观测带宽、降低采样速率的测试方法。该测试方法具有很好的灵活性和可扩展性,大大降低测试成本,因此具有很大的市场应有价值。

LTE（long term evolution） and its advanced technology have become a hotspot for worldwide mobile communication development.Terminal RF test is a weak point in LTE industry chain.This paper proposes a novel method for testing the adjacent channel leakage ratio（ACLR） through modifying the frequency of local RF oscillator to increase the observation bandwidth and reduce the sampling speed.The proposed method has great market value for its high flexibility,scalability and low hardware costs.