利用白光干涉谱测定云母片的快慢轴

Determination of the fast and slow axis of the mica plate with interference spectroscopy of the white light

白光照射到透明云母薄片时,后侧内表面产生的反射光与入射光会在云母片的前表面发生干涉.利用光谱仪可以观察到由于干涉而形成的条状光谱.改变入射光的偏振方向,可以观察到由于云母薄片双折射特性引起的干涉条纹的移动.根据条纹移动的方向,可以判定出云母片两正交的光轴方向上折射率的差异,从而判定出其快轴和慢轴.

The reflected light from the inner surface of the posterior side will interfere with the incidence light,when the white light irradiate to the mica plate.A fluted spectrum with different colors can be observed by using spectrometer.Changing the polarization direction of incident light,the difference of index at orthogonal optical axis of the mica plate can be rapidly determined upon the moving direction of the grooves since the birefringence,and then the fast and slow axis can be deduced.