基于传输矩阵法讨论光疏介质表面的全反射

Study of total reflection on the ultra-thin material with low refractive index using transfer matrix method

探究了光在光密介质与超薄光疏介质界面处的全反射,通过在光密介质中嵌入一光疏介质薄层,利用传输矩阵法,定量地分析了入射角度以及光疏介质的厚度对反射率的影响.数值模拟结果表明,当光疏介质的厚度小于约一个波长时,即使入射角大于全反射的临界角,反射率也不一定会达到1,也就是说,光学隧道效应将会出现.

Total reflection at the interface between a medium with high refractive index and an ultra-thin material with low refractive index is studied.An ultra-thin material with low refractive index is inserted in the medium with high refractive index.The reflection curve is analyzed by using the transfer matrix method.Numerical simulations show that the reflectivity can not reach 100% although the incident angle is lager than the critical angle of total reflection when the material with low refractive index is thinner than the wavelength.That is,the optical tunneling effect appears.The quantitative analysis is helpful to understand the concepts of evanescent waves and optical tunneling effects.