6FREMONT H, DELEAGE J Y, WEIDE-ZAAGE K, et al. How to study delamination in plastic encapsulated devices [J]. Microelectron Reliab, 2004, 44(9/10/11): 1311-1316.
7VAN DRIEL W D, VAN GILS M A J, VAN SILFHOUT R B R, et al. Prediction of delamination related IC & packaging reliability problems [J]. Microeleetron Reliab, 2005, 45(9/10/11): 1633-1638.
8肖海洪.塑封分立器件的分层问题研究[D].成都:电子科技大学,2012.
9TANG S, GUO T F, CHENG L. Rate dependent interface delamination in plastic IC packages [C]//2007 9th Electronics Packaging Technology Conference. Singapore: IEEE, 2007.
10TAY A A O. Modeling of interracial delamination in plastic IC packages under hygrothermal loading [J]. J Electron Paekg, 2005, 127(3): 268-275.