摘要
显卡芯片是构成计算机最重要的部件之一,运用芯片失效分析的方法和依照严谨的失效分析流程准确迅速地发现芯片失效的根本原因对显卡芯片及计算机系统集成制造的品质改善至关重要。由于显卡芯片具有一定的特殊性,因此我们根据半导体器件失效分析的基本流程提出了针对显卡芯片显示异常的失效分析的改进流程。同时通过对一组显卡芯片显示异常实际案例的分析,运用显卡芯片显示花屏的主要分析方法,找到显卡芯片显示花屏的根本原因,体现其失效分析流程的针对性和有效性。
The graphic chip is one of key parts of computer.Following up major failure analysis methods and a specific failure analysis process are very important to the quality improvement of graphic chip and computer manufacturing,so that we could find out the root causes of failing chips correctly and timely.Based on basic IC failure analysis process and failure analysis of a serial of abnormal display on graphic chips,this paper has detailed the major failure analysis methods to find out root causes and summarize graphic chip failure analysis process of this failure mode.
出处
《电子测试》
2011年第10期13-18,共6页
Electronic Test