背散射电子图像分析在水泥基材料微观结构研究中的应用

Application of Backscattered Electron Imaging and Image Analysis in Microstructure Research on Cement-Based Materials

自上世纪80年代,国外研究者成功将背散射电子图像分析(backscattered electron imaging and image analysis,BSE-IA)技术应用于水泥基材料微观结构的研究中,在微观定性研究及物相定量分析方面,都获得不同于其他研究方法的研究结果。介绍了BSE-IA技术在水泥基材料研究中的应用原理及国外应用现状,并与其他研究方法比较,分析了用此研究方法定性、定量研究水泥浆体中不同物相的优缺点,表明该技术在水泥基材料研究中具有独特的优势。

Since the 1980s, backscattered electron, imaging and image analysis （BSE-IA） technique for polished surfaces has been proposed as a method to analyze cement and concrete microstructures. This technique is widely applied for both qualitative analysis and quantitative analysis. The principle of BSE-IA technique and its application in cement paste and concrete research were reviewed, and the advantages and disadvantages of this technique in qualitative and quantitative analysis of different phases in cement paste were compared with those of other techniques. It was indicated that BSE-IA technique had some distinctive advantages for cement studies.