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大功率垂直腔面发射激光器列阵的串接结构 被引量:5

High-power vertical cavity surface emitting laser array in series structure
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摘要 为了在不提高驱动电流的前提下增大垂直腔面发射激光器的输出功率,提出了一种将多个垂直腔面发射激光器芯片串接在一起的结构。首先,将垂直腔面发射激光器芯片焊接在氮化铝陶瓷热沉上,接着用金丝引线的方法以串联方式将芯片连接在一起。分别测试了串接4个、2个和单个芯片器件的微秒脉冲输出功率和纳秒脉冲输出功率,其分别为775,416,217mW和18.9,9.8,5W,测试结果显示串接4个和2个芯片器件的输出功率分别约为单个芯片输出功率的4倍和2倍。串接多个芯片器件的发射光谱半高宽(FWHM)比单个器件的略宽,但是可以通过选择均一性良好的芯片来解决这一问题。实验显示,串接结构可以实现在不提高驱动电流的条件下大幅度提高输出功率。 For increasing the output powers without improving drive currents to high power Vertical Cavity Surface Emitting Lasers(VCSELs),a VCSEL in series structure was presented.First,the VCSEL chips were soldered on a AlN ceramic heat sink,then the chips were connected by a wire bonding in series.The output powers of four-chip devices in series,two-chip devices in series and a single device were measured under microsecond and nanosecond pulses,which are 775,416,217 mW and 18.9,9.8,5 W,respectively.Test results show that the output powers of the first two kinds of devices in series are about 4 times and twice that of the single device.Moreover,the Full Width at Half Maximum(FWHM) of multiple-chip devices in series is slightly wider than that of the single device,which can be improved by choosing good uniformity cascade chips.In conclusion,the VCSEL in series structure can increase the output power without improving the drive current.
出处 《光学精密工程》 EI CAS CSCD 北大核心 2011年第10期2309-2313,共5页 Optics and Precision Engineering
基金 国家自然科学基金重点项目(No.90923037) 吉林省科技发展计划资助项目(No.20080335)
关键词 垂直腔面发射激光器 输出功率 串联 Vertical Cavity Surface Emitting Laser(VCSEL) output power series
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  • 1晏长岭,秦莉,宁永强,张淑敏,王青,赵路民,刘云,王立军,钟景昌.GaInAs/GaAs应变量子阱能带结构的计算[J].激光杂志,2004,25(5):29-31. 被引量:10
  • 2马莹,王成,缪同群.VCSEL直接倍频蓝光固态激光器的研究[J].光学精密工程,2005,13(3):253-259. 被引量:13
  • 3张爽,郭树旭,郭欣,曹军胜,郜峰利,单江东,任瑞治.激光器阵列的非本征理想因子[J].Journal of Semiconductors,2007,28(5):768-773. 被引量:8
  • 4VINCENT L, FRANCOIS J V, SHAILENDRA B, et al: High power A1 free active region (it 852 nm) DFB laser diodes for atomic clocks and inter- ferometry applications [-C]. Conference on Lasers and Electro-Optics, California, 2006:398-405.
  • 5KARACHINSKY L Y, NOVIKOV I I, SHERNY- AKOV Y M, et al: High power GaAs/A1GaAs la- sers (it 850 nm) with ultranarrow vertical beam divergence [J]. Applied Physics Letters, 2006, 89 (23) : 23114-1-23114-3.
  • 6KLEHR A, WENZEL H, BROX O, et al: High power DFB lasers for D1 and D2 caesium absorption spectroscopy and atomic clocks [C]. Novel In- Plane Semiconductor Lasers , San Jose, 2008: 69091E-1-69091E 10.
  • 7ZORN M, ZETTLER J T, KNALLER A, et al: In situ determination and control of A1GaInP com- position during MOVPE growth [J]. Journal of Crystal Growth, 2006, 287(2): 637-641.
  • 8BUGGE F, ZORN M, ZEIMER V, et al: MOVPE growth of InGaAs/GaAsP-MQWs for high power laser diodes studied by reflectance anisotropy spectrosco- py [J]. Journal of Crystal Growth, 2009, 311 (4) : 1065-1069.
  • 9ZHANGY, NINGY, ZHANG L, etal: Design and comparison of GaAs, GaAsP and InGaA1As quantum-well active regions for 808-nm VCSELs [J]. Optics Express, 2011, 19(13): 12569- 12581.
  • 10Hongyan Li, Liyun Qi, Jiawei Shi, et al. Effective method for evaluation of semiconductor laser quality [J]. Microelectronics Re- liability 2000,40:333-337.

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