半导体级别故障预测与健康管理

Review of Prognostics and Health Management on the Semiconductor-Level

随着集成电路特征尺寸按比例缩小,其可靠性问题越来越突出。为了避免因集成电路失效而发生灾难性后果,有必要对集成电路进行故障预测与健康管理。首先,介绍了故障预测与健康管理技术的发展概况;然后,阐述了实施半导体级别故障预测与健康管理的两个主要方法:预兆单元法和失效先兆监测推理法,并根据相关案例进行了分析;最后,指出了该技术面临的挑战。

With the feature size of ICs（integrated circuits）scaling down,their reliability problems become more and more severe.Implementation of PHM to ICs is to prevent catastrophes from occurring.In this paper,the development of PHM is introduced at first.Then two main methods of semiconductor-level PHM are illustrated with some cases.Finally,some challenges for the technology are presented.