期刊文献+

表面处理对AlGaN欧姆接触的影响及机理

Influence and Mechanism of Surface Treatment on Ohmic Contacts to AlGaN Surface
下载PDF
导出
摘要 研究了溶液表面处理对AlGaN欧姆接触的影响及机理。用氟硝酸(HNO3+HF)、稀盐酸(HCl)和硫代乙酰胺(CS3CSNH2)溶液处理AlGaN表面后,Ti/Al/Ti/Au电极的比接触电阻率有显著的降低。样品表面Ga3d与O1s的X射线光电子能谱(XPS)测试结果显示:氧元素含量明显降低,表明这三种溶液可以有效地去除AlGaN表面氧化层,其中CS3CSNH2效果最佳;Ga3d峰位在表面处理后发生蓝移现象,相当于AlGaN表面处的费米能级向导带一侧移动,使电子在隧穿过程中的有效势垒高度降低。以上两个因素均对优化AlGaN/GaN欧姆接触有十分重要的意义。 Tthe influence of surface treatment on the ohmic contacts to AlGaN/GaN heterostructure is investigated by using different solutions.The specific contact resistivity dramatically decreases after the treatments.To investigate the mechanism of this improvement on ohmic contacts,the chemical properties of the AlGaN/GaN surface are characterized by monitoring the Ga 3d and O1s peaks using X-ray photoelectron spectroscopy(XPS) measurement.The decrease of the oxygen concentration indicates that the solutions can effectively remove oxides from the samples' surface,especially CS3CSNH2.The blue shifts of the Ga 3d peaks demonstrate that Fermi level pinning effect at the surface is mitigated after the surface treatment,resulting in the decrease of the effective barrier height for electron tunneling transport.Both these two factors contribute to the formation of high-quality ohmic contacts of Ti/Al/Ti/Au on AlGaN/GaN surface.
出处 《半导体光电》 CAS CSCD 北大核心 2011年第5期650-652,718,共4页 Semiconductor Optoelectronics
基金 国家自然科学基金项目(51002085)
关键词 ALGAN/GAN异质结 表面处理 欧姆接触 XPS能谱 AlGaN/GaN heterostructure surface treatment ohmic contacts XPS spectra
  • 相关文献

参考文献1

二级参考文献45

  • 1刘键,李诚瞻,魏珂,和致经,刘果果,郑英奎,刘新宇,吴德馨.具有低欧姆接触电阻的高性能AlGaN/GaN HEMT器件研制[J].Journal of Semiconductors,2006,27(z1):262-265. 被引量:1
  • 2李娜,赵德刚,杨辉.AlGaN/GaN异质结中极化效应的模拟[J].中国科学(G辑),2004,34(4):422-429. 被引量:5
  • 3杨燕,郝跃,张进城,王冲,冯倩.AlGaN势垒层应变弛豫度对高Al含量Al_xGa_(1-x)N/GaN HEMT性能的影响[J].中国科学(E辑),2006,36(9):925-932. 被引量:1
  • 4Zainuriah Hassan, Fong Kwong Yam, Yan Cheung Lee, et al. Effects of post annealing treatments on the characteristics of ohmic contacts on n-type A1GaN [J]. SPIE, 2005,5739: 169.
  • 5B Shen, H M Zhou,J Liu, et al. Ohmic contact and interfacial reaction of Ti/A1/Pt/Au metallic multi-layers on n-AlxGa1-xN/GaN heterostructures [ J ]. Optical Materials,2003, 23(1/2) :197 - 201.
  • 6G Vanko,T Lalinsk), z. Mozolovd, et al. Nb-Ti/A1/Ni/ Au based ohmic contacts to A1GaN/GaN[J]. Vacuum, 2007,82(2) : 193 - 196.
  • 7S Kaciulis, L Pandolfi, S Viticoli, et al. Characterization of Ohmic contacts on GaN/A1GaN heterostructures[J ]. Applied Surface Science, 2006,253(3) :1055 - 1064.
  • 8Deepak Selvanathan, Fitih M Mohammed, Jeong-Oun Bae, et al. Investigation of surface treatment schemes on n-type GaIN and A10.20Ga0.80N [J]. Journal of Vacuum Science Technology B, 2005, 23(6) :2538 - 2544.
  • 9J A Bardwell, G I Sproule, Y Liu, et al. Comparison of two different Ti/A1/Ti/Au ohmic metallization schemes for AlGaN/GaN [J ]. Journal of Vacuum Science Technology B, 2002, 20(4) :1444 - 1447.
  • 10Alexei Vertiatchikh, Ed Kaminsky, Julie Teetsov, et al. Structural properties of alloyed Ti/A1/Ti/Au and Ti/A1/ Mo/Au ohmic contacts to AIGaN/GaN [ J ]. Solid-State Electronics, 2006(7/8) : 1425 - 1429.

共引文献1

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部