摘要
针对散粒噪声难以测量的特点,提出了一种低温散粒噪声测试方法。在屏蔽环境下,将被测器件置于低温装置内,有效抑制了外界电磁波和热噪声的干扰,采用背景噪声充分低的放大器以及偏置器、适配器等,建立低温散粒噪声测试系统。应用该系统对PN结二极管进行散粒噪声测试,得到了很好的测试结果。
Because it is hard to detect the Schottky noise in diodes,a method of low-temperature testing for Schottky noise in diodes is proposed.Before testing,UUT is putted into a low-temperature device in the shielding room to restrain the electromagnetic wave and thermal noise.The testing system is composed of the low noise amplifier,adapter and so on.Schottky noise of p-n junction diode was tested by this system.A good result was got.
出处
《现代电子技术》
2011年第22期162-164,共3页
Modern Electronics Technique
关键词
散粒噪声
扩散电流
低温装置
PN结
p-n junction diode
shot noise
diffuse current
low-temperature device
