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Microstructures and fatigue-free properties of the La^(3+) and Nd^(3+) doped Bi_4Ti_3O_(12) thin films prepared by modified sol-gel technique

Microstructures and fatigue-free properties of the La^(3+) and Nd^(3+) doped Bi_4Ti_3O_(12) thin films prepared by modified sol-gel technique
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摘要 Ferroelectric Bi3.25La0.75Ti3O12 (BLT) and Bi3.15Nd0.85Ti3O12 (BNT) thin films were fab- ricated on Pt/TiO2/SiO2/Si (100) substrates by a modified sol-gel technique. X-ray diffraction indicated that these films were of single phase with random polycrystal- line orientations. The surface morphologies of the films were observed by scanning electron microscope, showing uniform, dense films with grain size of 50―100 nm. Well-saturated hysteresis loops of the films were obtained in metal-ferroelectric- metal type capacitors with Cu top electrodes at an applied voltage of 400 kV/cm, giving the remanent polarization (2Pr) and coercive field (2Ec) values of the films of 25.1 μC/cm2 and 203 kV/cm for BLT, and 44.2 μC/cm2 and 296 kV/cm for BNT, re- spectively. Moreover, these capacitors did not show fatigue behaviors after up to 1.75×1010 switching cycles at the test frequency of 1 MHz, suggesting a fatigue-free character. The influences of the La3+ and Nd3+ doping on the properties of the films were comparatively discussed. Ferroelectric Bi3.25La0.75Ti3O12 (BLT) and Bi3.15Nd0.85Ti3O12 (BNT) thin films were fab- ricated on Pt/TiO2/SiO2/Si (100) substrates by a modified sol-gel technique. X-ray diffraction indicated that these films were of single phase with random polycrystal- line orientations. The surface morphologies of the films were observed by scanning electron microscope, showing uniform, dense films with grain size of 50―100 nm. Well-saturated hysteresis loops of the films were obtained in metal-ferroelectric- metal type capacitors with Cu top electrodes at an applied voltage of 400 kV/cm, giving the remanent polarization (2Pr) and coercive field (2Ec) values of the films of 25.1 μC/cm2 and 203 kV/cm for BLT, and 44.2 μC/cm2 and 296 kV/cm for BNT, re- spectively. Moreover, these capacitors did not show fatigue behaviors after up to 1.75×1010 switching cycles at the test frequency of 1 MHz, suggesting a fatigue-free character. The influences of the La3+ and Nd3+ doping on the properties of the films were comparatively discussed.
出处 《Science China(Technological Sciences)》 SCIE EI CAS 2008年第11期1843-1849,共7页 中国科学(技术科学英文版)
基金 the National Key Basic Research and Development Program of China (Grant No. 2006CB932305) the Natural Science Foundation of Hubei Province, China (Grant No. 2004ABA082)
关键词 BISMUTH OXIDES FERROELECTRICS fatigue sol-gel TECHNIQUE bismuth oxides, ferroelectrics, fatigue, sol-gel technique
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