摘要
采用瑞奇-康芒实验装置和利用圆Zernike多项式分别对不同遮拦比环域进行了拟合。结果表明,在遮拦比小于0.4的环域上,用圆Zernike多项式拟合,残差PV和残差RMS值不是很大;在遮拦比大于0.4的环域上,需用环Zernike多项式拟合才能保证一定的拟合精度。
Zernike circle polynomials fitting of different ε annular regions is carried out on the Ritchey-Common test.Analysis results show that difference PV and RMS is not large on annular region of ε< 0.4,and that higher fitting precision is received by annular Zernike polynomials if ε>0.4.
出处
《光学技术》
CAS
CSCD
北大核心
2008年第S1期21-23,共3页
Optical Technique
