摘要
采用X射线荧光能谱仪,分别测量基底元素的强度,以求得金薄膜和镀层的厚度。用镀金片检验,当薄膜和镀层厚度t<3.0μm时,测量偏差<0.10μm,方法简便,可方便地用于镀层厚度的控制生产中。
Measure the strength of base element respectivly by X-ray fluorescent spectrometer to obtain the thickness of gold membrance and cating. To test by gold plate, the measuring deviation is<0.10m, when the thickness of gold membrance and coating is t<0. 3μm. The method is simple and convenient for the controlling production of the coating thickness.
出处
《福建分析测试》
CAS
2000年第2期1231-1233,共3页
Fujian Analysis & Testing
