摘要
The dielectric constant and dielectric loss of Te10Ge10Se80-xSbx (x=3, 6, 12 at. pct) chalcogenide alloys were measured in the temperature range (300 to 453 K) and the frequency range (100 Hz to 100 kHz). The real dielectric constant ∈′and imaginary dielectric constant ∈' show a decrease with increasing frequency and an increase with increasing temperature. All samples display dielectric dispersion. Both ∈′ and ∈' show a Debye relaxation type. The enthalpy activation energy ΔH and activation energy WH were calculated. Cole-Cole diagram consists of an arc of semicircle shifted from the origin and its center below the real axis at high frequency
The dielectric constant and dielectric loss of Te10Ge10Se80-xSbx (x=3, 6, 12 at. pct) chalcogenide alloys were measured in the temperature range (300 to 453 K) and the frequency range (100 Hz to 100 kHz). The real dielectric constant ∈′and imaginary dielectric constant ∈' show a decrease with increasing frequency and an increase with increasing temperature. All samples display dielectric dispersion. Both ∈′ and ∈' show a Debye relaxation type. The enthalpy activation energy ΔH and activation energy WH were calculated. Cole-Cole diagram consists of an arc of semicircle shifted from the origin and its center below the real axis at high frequency
