统计逼近下的集成电路成品率优化方法

IC Yield Optimization Technology with Statistical Approximation

考察了集成电路统计最优化问题的特殊性,用统计方法逼近合格电路参数可接受域,并以此模型估计参数成品率,进行成品率优化,又结合CMOS集成运放电路的设计验证了方法的可行性.

The specialities of IC statistical optimal problem is considered, an approath for parametric yield optimization is given in which the statistical approximation model to the acceptable region is used to estimate the parametric yield, the design of a CMOS operational amplifier is presented to verify the feasibility of the method.