静电放电(ESD)的测试与ESD引起元器件失效的机理

综述了辐射引起的ESD的预测，直接放电的ESD的预测．这些预测包括静电场、在敏感电路上的感应电压、在电线上ESD感应电压等的预测．同时还介绍了合适的屏蔽方法以改善ESD的影响以及引起元器件失效的机理．

This paper deals with the predictions of radiation-induced ESD and direct discharge ESD, includingthose of electric field, voltage induced on a susoeptible circuit and ESD induced voltages on cables, It also presents the proper cable shielding for decrease of ESD effect and the part failure mechanism.