BHF－Ⅰ便携式痕量离子智能分析仪的研制

The Development of BHF-Ⅰ Portable and Intelligent Instrument for Analyzing the Trace-Ion

介绍了根据Ｄ．Ｊａｇｎｅｒ提出的电位溶出分析原理而研制成功的一种便携式痕量离子智能分析仪．该仪器采用了单片机为智能核心部件，并首先使用了多扫描采集技术．它不仅实现了便携式与智能化，解决了野外现场检测痕量离子的问题，而且其检测灵敏度达到了０．１ｐｐｂ（对Ｃｄ２＋），相对偏差小于１％．

This paper introduces a portable and intelligent instrument for analyzing the trace-ion,which is on the basis of Potentioncetric Stripping Analysis srinciple advanced by D. Janger. Inthe instrument,we use MCS-51 chip microprocessor as the key unit and adopt advanced multiscanning techniques. As a result, not only have the portability and intelligent been realized so thatthe problem of measureing trace-ion in the field can be resolved, but also the sersitivity of themethod is 0.1ppb for Cd2+ and the relative standard diviation do not exceed 1%.